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Scanning Electron Microscopy and X-Ray Microanalysis
Springer-Verlag New York Inc.
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Springer-Verlag New York Inc.
Scanning Electron Microscopy and X-Ray Microanalysis
- | Author: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
- | Publisher: Springer-Verlag New York Inc.
- | Publication Date: Nov 18, 2017
- | Country of Publication: United States
- | Number of Pages: 550 pages
- | Language: NA
- | Binding: Hardback
- | ISBN-10: 149396674X
- | ISBN-13: 9781493966745
- By (Author):
- Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
- Publisher:
- Springer-Verlag New York Inc.
- Publication Date:
- Nov 18, 2017
- Country of Publication:
- United States
- Language:
- NA
- Number of pages:
- 550 pages
- Binding:
- Hardback
- ISBN-10:
- 149396674X
- ISBN-13:
- 9781493966745