Semiconductor Interfaces: Formation And Properties: Proceedings Of The Workkshop, Les Houches, France February 24-March 6, 1987
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Semiconductor Interfaces: Formation And Properties: Proceedings Of The Workkshop, Les Houches, France February 24-March 6, 1987

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU:
9783642729690
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UPC:
9783642729690
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Description
(ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.


  • | Edited By: Guy Lelay
  • | Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
  • | Publication Date: Dec 06, 2011
  • | Country of Publication: Germany
  • | Number of Pages: 389 pages
  • | Language: Unknown
  • | Binding: Softback
  • | ISBN-10: 364272969X
  • | ISBN-13: 9783642729690
Additional Information
Edited By:
Guy Lelay
Publisher:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Publication Date:
Dec 06, 2011
Country of Publication:
Germany
Language:
Unknown
Number of pages:
389 pages
Binding:
Softback
ISBN-10:
364272969X
ISBN-13:
9783642729690
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