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Semiconductor Interfaces: Formation And Properties: Proceedings Of The Workkshop, Les Houches, France February 24-March 6, 1987
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
£109.99
£62.39
(ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.
- | Edited By: Guy Lelay
- | Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- | Publication Date: Dec 06, 2011
- | Country of Publication: Germany
- | Number of Pages: 389 pages
- | Language: Unknown
- | Binding: Softback
- | ISBN-10: 364272969X
- | ISBN-13: 9783642729690
- Edited By:
- Guy Lelay
- Publisher:
- Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Publication Date:
- Dec 06, 2011
- Country of Publication:
- Germany
- Language:
- Unknown
- Number of pages:
- 389 pages
- Binding:
- Softback
- ISBN-10:
- 364272969X
- ISBN-13:
- 9783642729690